| 商品简介： |
| 特點說明．0.1%基本精確度．測試頻率可達1MHz．測試速度可達每秒30個項目．提供治具短路 / 開路校正功能．提供完整的測試功能, 一次完成．提供Meter模式, 可精確測量．內建8mA DC Bias Option．可達80個測試點數．直覺式人性化操作介面．RS-232, GPIB介面與電腦連線 |
详细说明： |
| 系統規格表 |
|
Model |
5235 |
5236 |
5237 |
| Frequency |
200K |
500K |
1M |
| Test Parameter |
|
| Transformer Scanning |
Turn Ratio, Phase, L, Q, Leakage L, Balance,
ACR, Cp, D, X, Y, DCR, Pin Short |
| Test Signals Information |
|
| Test Frequency (0.01%, 5digits) |
Turn |
1kHz~200kHz |
1kHz~500kHz |
1kHz~1MHz |
| Others |
20Hz~200kHz |
20Hz~500kHz |
20Hz~1MHz |
| Output Impedance |
100Ω |
| Measurement Range |
|
| L, LK |
0.00001uH~9999.99H |
| C |
0.00001pF~999.999mF |
| Q, D |
0.00001~99999 |
| Z, X, R |
0.00001Ω~99.9999MΩ |
| Y |
0.01nS~99.9999S |
| θ |
-90.00º~+90.00º |
| DCR |
0.01mΩ~99.999MΩ |
| Turn |
0.01~99999.99turns |
| Pin-Short |
12 pairs, between pin to pin |
| Basic Accuracy |
|
| L, LK, C, Z, X, Y, R, DCR |
0.1% (1kHz if AC parameter) |
| Q, D |
0.0005 (1kHz) |
| θ |
0.03º (1kHz) |
| Turn |
0.5% (1kHz) |
| Measurement Speed (Fastest) |
|
| L, LK, C, Z, X, Y, R, D, θ |
75ms |
| DCR |
30m/s |
| Turn |
75ms |
| Judge |
|
| Transformer Scanning |
PASS/FAIL judge of all test parameters
output from optional HANDLER interface |
| Test Channel |
|
| Trigger |
Internal, Manual, External |
| Display |
320*240 dot-matrix LCD display |
| Equivalent Circuit Mode |
Series, Parallel |
| Correction Function |
Open/Short Zeroing, Load deviatiom |
| Memory |
60 instrument setups |
| General |
40 Pin Test Fixture |
| Operation Environment |
Temperature :10ºC ~ 40ºC, Humidity :10%~90% RH |
| Power Consumption |
140VA max. |
| Power Requirement |
90Vac~125Vac or 190Vac~250Vac, 48Hz~62Hz |
| Weight |
Approx. 9kg |
| Dimension (W*H*D) |
480*180*320mm |
| ．詳細量測範圍請參考使用手冊 | |
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